CT Metrology Investigation of Detector Alignment | North Star Imaging

CT Metrology Investigation of Detector Alignment

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The influence of detector misalignment on Computed Tomography (CT) measurement accuracy was recently investigated with a NSI CXMM 50 and presented at the 2017 EUSPEN conference in Hannover, Germany.

The study was led by Valentina Aloisi, a Ph.D. Student at the University of Padova (Italy), in collaboration with Prof. Simone Carmignato and Prof. Enrico Savio of the University of Padova and Dr. Joe Schlecht and Dr. Eric Ferley of North Star Imaging.

Ms. Aloisi presented a poster on this investigation and its findings at the EUSPEN conference, titled “Experimental Investigation on the Influence of Detector Misalignment on X-Ray CT Measurement Accuracy”.

To learn more about this research study, contact marketing@4nsi.com.

Valentina Aloisi is a Ph.D. Student in the School of Industrial Engineering at the University of Padova, Italy. Her research activities are currently addressing: metrological performance verification of CT systems using conventional and helical scanning trajectories, the comparison between CT and CMM data and the influence of surface roughness on CT dimensional measurements.

During her studies she gained experiences in dimensional and surface metrology, including use of coordinate measuring machines (tactile and non-contact CMMs), as well as optical and contact profilometry. She holds a CMTrain – Level 2: CMM – Operator certification.