Keith Duncan to Speak at the NSI 2020 Technical Symposium

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Keith Duncan, Research Scientist at the Donald Danforth Plant Science Center has been using X-ray imaging technology in his work for several years. Keith explains why X-ray CT is important to the work and research he and his colleagues perform at the Plant Center. "I am a research scientist at the Danforth Plant Science Center in St. Louis, and I manage one of the only X-ray imaging facilities in the world dedicated exclusively to studying plant biology. We use non-destructive imaging to measure and evaluate complicated plant structures both above and below the soil line. Specifically we use our North Star Imaging X5000 system to study the morphology of above-ground structures like corn tassels and ears, panicles of wheat, rice, and sorghum, and the size, shape, and distribution of grapes in their clusters. In addition, we use non-destructive imaging to study root system architecture of many crop plants without having to rip them up from the soil. Accurate measurement of these complicated structures is the crucial first step in identifying the factors that influence how crop plants grow and develop, and how modern agricultural research can optimize these factors so plants can continue to succeed in a rapidly changing environment."

Join us at our 2020 Technical Symposium to hear more about how Keith uses X-ray technology in his research and developments.

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