CT Metrology

X-ray CT for Dimensional Metrology

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Metrology is the science of measurement. We've designed our X-ray systems to be capable of precise internal and external measurements for your metrology needs. Our CXMMs (Coordinate X-ray Measuring Machine) make use of non-contact and non-destructive technology that provides unique advantages compared to classical Coordinate Measuring Machines (CMMs).

Metrology Process

Advantages of CT over traditional measuring instruments

  • High density of information in a short amount of time
  • Dimensional measurements of internal and not accessible features
  • Measurements on deformable components
  • Dimensional control of assemblies
  • CAD comparison, fiber orientation analysis, wall thickness analysis

Examples


Metrology Whitepaper

Characterization of the effects of detector angular misalignments and accuracy enhancement of X-ray CT dimensional measurements

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