VIRTUAL EVENT - Digital Imaging and Ultrasonics for NDT 2020

Date

Tuesday Jul 28 - Thursday Jul 30

Location

Virtual Event

Join industry speakers, exhibitors, and your peers for two full days of technical presentations covering the latest advancements in digital imaging and ultrasonics techniques.


12:30 PM Wednesday, July 29, 2020

Presenting author(s): Mr Brett A Muehlhauser

Using Computed Tomography to help Accelerate the Development & Quality Improvements of Batteries

Computed Tomography (CT) is being successfully applied to many facets of Battery Manufacturing. CT applications range from assisting in product design through supporting Multiphysics simulation models, to final product evaluation. Extensive studies have been performed using CT to help detect, classify and better understand the types of discontinuities found within various battery manufacturing processes. New discoveries have been made while performing 4D CT which provides three-dimensional observation of movement and breakdown of internal material structures over time. A scan for the purpose of evaluating the product for internal integrity can also provide Metrology data for internal and external features. High speed CT scanning is now providing data at a pace capable of keeping up with high volume production. CT is rapidly becoming the "Go To" technology for evaluating many aspects of battery products. This presentation will include examples of CT being applied in the above applications as well as some of the latest CT development work being performed on batteries.

11:30 AM Thursday, July 30, 2020

Presenting author(s): Mr Camaron Lemmer

The Role of Computed Tomography and Digital Radiography in Failure Analysis

Computed Tomography (CT) and Digital Radiography (DR) are not only commonly applied in the evaluation of production products but they have also become critical tools in the failure analysis (FA) process. These tools are being successfully applied in many types of critical forensic investigations ranging from failures of microelectronics to larger structures with applications spanning across virtually all industries. CT and DR are used to compare exemplar products to failed products, not only capturing the differences, and identifying failures, but also helping to record the current condition of the entire failed product. The same data sets can also provide valuable information as to how products and complex assemblies may be physically segmented or disassembled without disrupting the actual point of failure that will be removed and further evaluated with other technologies such as a scanning electron microscope. This FA work is being applied to materials ranging from low density carbon and polymers to high density platinum and gold. A common practice in new product development is to perform CT scanning of multiple test samples before and after performing environmental or functional testing to better understand the impact of specific manufacturing process variabilities on product failures. Lastly, CT and DR is being used for In-Situ monitoring of products during functional testing to capture failures as they occur. This presentation will include examples of DR and CT being applied in the above applications

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