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Advantages of Using Advanced Scanning Styles (Vortex, Subpix, and Mosaix)

Anthony Talberg

Technical Trainer


Standard cone beam scanning is sufficient for many applications, but what about the applications where you cannot fit the part in a single detectors view? Physical size of a sample can be a limitation when trying to achieve a given resolution, or you may be dealing with artifact issues. All of these limitations are the reason that NSI has developed advanced scanning styles to overcome issues you may run into when a challenging application comes in.Vortex scanning is a commonly used scanning style by our NSI experts when a sample is very tall in one direction, such as a baseball bat. When looking for measurement…